The multi-laser XC65Dx laser scanner captures all 3D details of features, edges, pockets, ribs and freeform surfaces in a single scan. It’s entirely digital 3D digitizing operation boosts scanning frequency and drives smart laser intensity adaptation to scan any surface without user interaction.
Offering patented multi-laser capability, the XC65Dx(-LS) Cross Scanner captures all 3D details of features, edges, pockets, ribs and freeform surfaces in a single scan. Its cross pattern of 3 laser stripes allows it to acquire the full 3D view when scanning parts with more complex surface shapes and/or geometric features.
The XC65Dx Cross Scanner sets new productivity standards by introducing wider laser stripes and high-speed CMOS camera technology. Acquiring data at a faster pace makes it possible to drastically increase the velocity of the XC65Dx scanner during inspection. This boosts the number of features that can be scanned in the same time frame, or reduces the inspection cycle time for freeform parts
By continuously scanning parts from 3 different viewpoints, the Cross Scanner obtaines a full 3D view of the bore of a hole, or the flanges of a notch. As a result, geometric features can be extracted from the acquired point cloud with higher confidence, increasing the accuracy of feature dimensions obtained through scanning.
As the Cross Scanner creates a full 3D view in a single scan, there is no need to take multiple scans of the same feature using different scanner orientations. A full 3D view is also beneficial when scanning parts with more complex surface shapes. Real 3D measurement capability allows the scanner to capture extremely concave surfaces and the cavity of deep pockets. With laser beams being projected from 3 sides, the XC65Dx provides maximum surface coverage, avoiding shadow zones that may occur with a single-line laser scanner.
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canning from left side misses a dark zone on right sideS
canning from right side misses dark zone on left side
Cross scanner looks from multiple sides and avoids dark zones
As the Cross Scanner creates a full 3D view in a single scan, there is no need to take multiple scans of the same feature using different scanner orientations. This avoids repeated time-consuming re-orientations of the probe head, saving significant teaching effort and scanning execution time.
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iscrete rotations of a PH10 head when scanning a curved path
Continuous wrist (with C-axis) follows curve
Cross scanner eliminates the need for a C-axis rotation
Off-line recording the motion of the scanner motion during the inspection cycle speeds up measuring preparation and frees up CMM time. One hour is sufficient to set up and inspect cast driveline parts, whereas detailed tactile inspection programming easily takes more than a day.
To effectively scan surfaces with varying color or high reflectivity, Nikon Metrology introduces third-generation Enhanced Sensor Performance (ESP3). The proprietary technology not only provides automatic real-time adjustment of sensor settings between successive laser stripes, but also for each individual point of the laser stripe.
Benefit from the unique ability of laser scanners to measure soft and fragile surfaces, which cannot be measured using tactile inspection. By scanning fragile components, components cannot get scratched or damaged any other way.
The XC65Dx-LS scanner variant with a longer stand-off distance offers distinct advantages. By capturing geometry up to a distance of 170mm (7.1”), the scanner gains optimum access to cavity surfaces of body-in-white structures or scan over the clamps that hold components in position. For these reasons, the XC65Dx-LS scanner is used a lot on horizontal-arm CMMs used in the automotive industry.
The XC65Dx(-LS) scanners are compatible with common Renishaw indexing heads. The scanners also fit in the ACR racks and can be used in combination with tactile probes for e.g. alignment of the part. By docking a scanner in an dedicated ARC3 rack, zero warm-up time is obtained resulting in maximum productivity.
Nikon Metrology XC65D-LS scanners can be retrofitted on a wide range of CMM brands to boost inspection productivity of existing CMM installations.
Offering patented multi-laser capability, the XC65Dx(-LS) Cross Scanner captures all 3D details of features, edges, pockets, ribs and freeform surfaces in a single scan. Its cross pattern of 3 laser stripes allows it to acquire the full 3D view when scanning parts with more complex surface shapes and/or geometric features.
Compatible with Renishaw indexing heads and change racksThe XC65Dx(-LS) scanners are compatible with common Renishaw indexing heads. The scanners also fit in the ACR racks and can be used in combination with tactile probes for e.g. alignment of the part. By docking a scanner in an dedicated ARC3 rack, zero warm-up time is obtained resulting in maximum productivity.
Nikon Metrology XC65D-LS scanners can be retrofitted on a wide range of CMM brands to boost inspection productivity of existing CMM installations.
| XC65Dx | XC65Dx-LS | |
|---|---|---|
| Probing error(MPEp)1 | 12 µm (0.00047") | 15 μm (0.00060") |
| Ball bar length (MPEE)2 | 4+L/350(µm) (0.00016+L/350) (") |
4+L/350(µm) (0.00016+L/350) (") |
| Multi-stylus test (MPEal)3 | 9 μm (0.00035”) | 9 μm (0.00035”) |
| ISO Probing form error4 | 25 µm (0.00098”) | 35 µm (0.00138”) |
| ISO Probing size error all5 | 45 µm (0.00177”) | 80 µm (0.00315”) |
| ISO Probing dispersion value6 | 48 µm (0.00189”) | 60 µm (0.00236”) |
| ISO Cone angle7 | 115° | 125° |
| Scanning speed | Cross Scanner mode: 3 x 25,000 pts/s Line scanner mode: 1 x 75,000 pts/s 75 lines/s |
Cross Scanner mode: 3 x 25,000 pts/s Line scanner mode: 1 x 75,000 pts/s 75 lines/s |
| Width of view | 3x65 mm (3x2.56”) | 3x65 mm (3x2.56”) |
| Depth of view | 3x65 mm (3x2.56”) | 3x65 mm (3x2.56”) |
| Stand-off distance (approx.) | 75 mm (2.95”) | 170 mm (6.69”) |
| Dimensions | 155x86x142 mm (6.1x3.4x5.6”) | 155x86x142 mm (6.1x3.4x5.6”) |
| Weight (approx.) | 440 g (0.97 lbs) | 480 g (1.06 lbs) |
| Enhanced Scanner Performance | ESP3 | ESP3 |
| Laser safety | Class 2 | Class 2 |
| Probe head compatibility | PH10M, PH10MQ, CW43, PHS | PH10M, PH10MQ, CW43, PHS |
All accuracy specifications valid for a CMM with an accuracy of 2µm + L/350 or better using manufacturer supplied test sphere
1Nikon Metrology test comparable to EN/ISO 10360-2 MPEP using 1 sigma sphere fit.
2Nikon Metrology test comparable to EN/ISO 10360-2 MPEE
3Nikon Metrology test comparable to EN/ISO 10360-5 MPEAL
Accuracy specifications according ISO 10360-8:2013:
4PForm.Sph.1x25:Tr:ODS,MPE : Maximum probing form error using 25 representative points in translatory scanning mode
5PSize.Sph.All:Tr:ODS,MPE : Maximum probing size error All using all measured points in translatory scanning mode
6PForm.Sph.D95%:Tr:ODS,MPL : Maximum probing dispersion value using 95% of the measured points in translatory scanning mode
7Cone angle : Region of sphere on which the measured points are selected
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